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={\frac {299792458}{f}}} "Electromagnetic Theory for Microwaves and Optoelectronics". 2020-01-31 tarixində arxivləşdirilib. İstifadə tarixi: 2012-05-01...2 KB (206 söz) - 17:37, 3 yanvar 2025
olunur. "The life and times of the LED — a 100-year history" (PDF). The Optoelectronics Research Centre, University of Southampton. Aprel 2007. 15 September...5 KB (374 söz) - 12:26, 13 may 2023- TlInS2 amorphous films // Semiconductor Physics, Quantum Electronics & Optoelectronics. 2007. V.10. N.2. P. 58-61. 14. Mustafaeva S.N., Asadov M.M., Ismailov...10 KB (1.154 söz) - 20:27, 22 aprel 2025
optical absorption of Se95As5 system doped by atoms of samarium // J. of Optoelectronics and Advanced Materials-RC, vol.1, ISS .8, 2007, p.368-372 "İsayev Abasət...6 KB (426 söz) - 09:41, 10 sentyabr 2022
G. The Faraday effect in a quantum cylinder with finite thickness. Optoelectronics and Advanced Materials-Rapid communications, 2010, v.4, ISS.3, pp....5 KB (532 söz) - 17:42, 9 fevral 2025
relaxor-ferroelectric transition of TlInS2 with cationic impurities. Journal of Optoelectronics and Advanced Materials (JOAM), 2003, v.5, No.3,276 3. Relaxor properties...12 KB (1.175 söz) - 07:45, 9 aprel 2025- two-dimensional materials: A tutorial review". Optics Communications. Optoelectronics and Photonics Based on Two-dimensional Materials. 406. 2018-01-01:...12 KB (1.199 söz) - 13:32, 15 aprel 2025
- Hasanov A. R., Hasanov R. A. Acousto-optic communication line // Optoelectronics Advanced Materials – Rapid Communications, Vol. 11, No. 9–10, September-October...20 KB (1.912 söz) - 19:29, 8 noyabr 2024
126–131. Position-Width-Impulse Analysis of cyclic and random signals, Optoelectronics, Instrumentation and Data Processing Allerton Press, Inc. New-York...15 KB (1.692 söz) - 21:40, 10 fevral 2025
dynamics of ternary antiferromagnetic TlFeS2 crystal. Journals of Optoelectronics and advanced materials- Symposia .2009 vol 1, № 3, P.301–304. 11. Mustafaeva...14 KB (1.622 söz) - 20:12, 20 iyun 2024
- Гулуев. Robust algorithms of spectral analysis of veasuring information Optoelectronics, Instrumentation and Data Processing Allerton Press, Ins, 2001, №5